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【国际标准】 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
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标准简介适用范围：
暂无
标准号：
ISO 16413:2013 EN
标准名称：
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
英文名称：
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting标准状态：
废止-
发布日期：
2013-02-12 -
实施日期：
出版语种：
EN
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