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【国际标准】 Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
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标准简介适用范围：
暂无
标准号：
IEC 62899-503-3:2021 EN
标准名称：
Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
英文名称：
Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method标准状态：
现行-
发布日期：
2021-08-24 -
实施日期：
出版语种：
EN
- 其它标准
- 上一篇： IEC 62899-503-1:2020 EN aa0dae33 Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
- 下一篇： IEC 62899-505:2020 EN 2c2431d1 Printed electronics - Part 505: Quality assessment - Flexible gas sensor - Mechanical and thermal testing
- 推荐标准
- IEC 62899-503-1:2020 EN aa0dae33 Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
- IEC 62899-503-3:2021 EN 406fa739 Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
