
【国际标准】 Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
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适用范围:
暂无
标准号:
ISO 13084:2011 EN
标准名称:
Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
英文名称:
Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer标准状态:
废止-
发布日期:
2011-05-05 -
实施日期:
出版语种:
EN
- 其它标准
- 上一篇: ISO 13083:2015 EN 4887f48c Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- 下一篇: ISO 13084:2018 EN a2bd2b44 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
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