购物车
400-168-0010
- 您的位置：
- 快3网下载安装到手机 >>
- 全部标准分类 >>
- 国际标准 >>
- 31.220.10 >>
- IEC 63171-1:2024 EN ec4ef8e4 Connectors for electrical and electronic equipment - Part 1: Detail specification for 2-way, shielded or unshielded, free and fixed connectors - Mechanical mating information, pin assignment and additional requirements for Type 1 (copper LC style)
【国际标准】 Connectors for electrical and electronic equipment - Part 1: Detail specification for 2-way, shielded or unshielded, free and fixed connectors - Mechanical mating information, pin assignment and additional requirements for Type 1 (copper LC style)
本网站 发布时间：
2025-01-04
开通会员免费在线看70000余条国内标准，赠送文本下载次数，单本最低仅合13.3元！还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权！
查看详情>>
标准简介适用范围：
暂无
标准号：
IEC 63171-1:2024 EN
标准名称：
Connectors for electrical and electronic equipment - Part 1: Detail specification for 2-way, shielded or unshielded, free and fixed connectors - Mechanical mating information, pin assignment and additional requirements for Type 1 (copper LC style)
英文名称：
Connectors for electrical and electronic equipment - Part 1: Detail specification for 2-way, shielded or unshielded, free and fixed connectors - Mechanical mating information, pin assignment and additional requirements for Type 1 (copper LC style)标准状态：
现行-
发布日期：
2024-04-03 -
实施日期：
出版语种：
EN
- 其它标准
- 上一篇： IEC 63171-1:2020 EN-FR 15b1063d Connectors for electrical and electronic equipment - Part 1: Detail specification for two-way, shielded or unshielded, free and fixed connectors - Mechanical mating information, pin assignment and additional requirements for Type 1 copper LC style
- 下一篇： IEC 63171-2:2021 EN 373ee6b0 Connectors for electrical and electronic equipment - Part 2: Detail specification for 2-way, shielded or unshielded, free and fixed connectors: mechanical mating information, pin assignment and additional requirements for type 2
- 推荐标准
- IEC 60068-2-43:2003 EN-FR d06e0a32 Environmental testing - Part 2-43: Tests - Test Kd: Hydrogen sulphide test for contacts and connections
- IEC 60130-10:1971 EN-FR 37cc3086 Connectors for frequencies below 3 MHz. Part 10: Connectors for coupling an external low-voltage power supply to portable entertainment equipment
- IEC 60130-12:1976 EN-FR a4b8c730 Connectors for frequencies below 3 MHz. Part 12: Link and test connectors
- IEC 60130-5:1966 EN-FR 7341cdf1 Connectors for frequencies below 3 MHz. Part 5: Rectangular multipole connectors with blade contacts
- IEC 60268-11:1987/AMD1:1989 EN-FR 1fe38427 Amendment 1 - Sound system equipment. Part 11: Application of connectors for the interconnection of sound system components
- IEC 60268-11:1987/AMD2:1991 EN-FR af9f0039 Amendment 2 - Sound system equipment. Part 11: Application of connectors for the interconnection of sound system components
- IEC 60268-12:1987/AMD1:1991 EN-FR ffdb52df Amendment 1 - Sound system equipment. Part 12: Application of connectors for broadcast and similar use
- IEC 60268-12:1987/AMD2:1994 EN-FR 2b995d3d Amendment 2 - Sound system equipment. Part 12: Application of connectors for broadcast and similar use
- IEC 60352-2:2006/AMD1:2013 EN-FR 9b25ede0 Amendment 1 - Solderless connections - Part 2: Crimped connections - General requirements, test methods and practical guidance
- IEC 60352-5:2020 EN-FR 04844d6b Solderless connections - Part 5: Press-in connections - General requirements, test methods and practical guidance
- IEC 60352-7:2002 EN-FR e54bc1cd Solderless connections - Part 7: Spring clamp connections - General requirements, test methods and practical guidance
- IEC 60352-7:2002 EN_D 13599b90 Solderless connections - Part 7: Spring clamp connections - General requirements, test methods and practical guidance
- IEC 60352-7:2020 RLV EN b7fe7d55 Solderless connections - Part 7: Spring clamp connections - General requirements, test methods and practical guidance
- IEC 60512-1-101:2015 EN-FR 7f7d4e3a Connectors for electronic equipment - Tests and measurements - Part 1-101: Blank detail specification
- IEC 60512-1-2:2002 EN-FR 52038c88 Connectors for electronic equipment - Tests and measurements - Part 1-2: General examination - Test 1b: Examination of dimension and mass
