
【国际标准】 Surface chemical analysis — Information formats
本网站 发布时间:
2024-05-11
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!  
查看详情>>

适用范围:
暂无
标准号:
ISO 14975:2000 EN
标准名称:
Surface chemical analysis — Information formats
英文名称:
Surface chemical analysis — Information formats标准状态:
现行-
发布日期:
2000-12-07 -
实施日期:
出版语种:
EN
- 推荐标准
- ISO 14976:1998 EN 50751716 Surface chemical analysis — Data transfer format
- ISO 16413:2020 EN 0cb0b8cc Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
- ISO 14975:2000 EN 47284c10 Surface chemical analysis — Information formats
- ISO 16413:2013 EN 4223866c Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting