购物车
400-168-0010
- 您的位置：
- 快3网下载安装到手机 >>
- 全部标准分类 >>
- 国际标准 >>
- 31.140 >>
- IEC 60444-11:2010 EN-FR 59fa222e Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
【国际标准】 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
本网站 发布时间：
2024-05-13
开通会员免费在线看70000余条国内标准，赠送文本下载次数，单本最低仅合13.3元！还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权！
查看详情>>
标准简介适用范围：
暂无
标准号：
IEC 60444-11:2010 EN-FR
标准名称：
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
英文名称：
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction标准状态：
现行-
发布日期：
2010-10-07 -
实施日期：
出版语种：
EN-FR
- 其它标准
- 上一篇： IEC 60442:1998/AMD1:2003 EN-FR 7b966394 Amendment 1 - Electric toasters for household and similar purposes - Methods for measuring the performance
- 下一篇： IEC 60444-1:1986 EN-FR bb39c7ce Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
- 推荐标准
- IEC 60050-561:1991 EN-FR-RU 8c928dba International Electrotechnical Vocabulary - Chapter 561: Piezoelectric devices for frequency control and selection
- IEC 60050-561:1991/AMD1:1995 EN-FR-RU 90df54e2 Amendment 1 - International Electrotechnical Vocabulary - Chapter 561: Piezoelectric devices for frequency control and selection
- IEC 60050-561:2014 EN-FR fe859610 International electrotecnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC 60050-561:2014/AMD3:2021 EN-FR 9c41ce6d Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC 60050-561:2014/AMD4:2021 EN-FR 0f2d71bc Amendment 4 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- IEC 60122-1:2002+AMD1:2017 CSV EN 50d78e26 Quartz crystal units of assessed quality - Part 1: Generic specification
- IEC 60122-1:2002+AMD1:2017 CSV EN-FR 2dede4c1 Quartz crystal units of assessed quality - Part 1: Generic specification
- IEC 60122-3:2010 EN-FR ce4e3f3d Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
- IEC 60122-4:2019 EN-FR d140724e Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
- IEC 60368-1:2000/AMD1:2004 EN_D 7c535930 Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
- IEC 60368-4:2000 EN-FR c4ba995d Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
- IEC 60444-11:2010 EN-FR 59fa222e Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
- IEC 60444-5:1995 EN-FR 3f94a798 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
- IEC 60444-6:2013 EN-FR 65d313d4 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
- IEC 60444-8:2003 EN_D 7c4c1970 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
