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【国际标准】 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
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标准简介适用范围：
暂无
标准号：
IEC 60749-8:2002 EN-FR
标准名称：
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
英文名称：
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing标准状态：
现行-
发布日期：
2002-08-30 -
实施日期：
出版语种：
EN-FR
- 其它标准
- 上一篇： IEC 60749-7:2011 EN-FR fa63e0f3 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
- 下一篇： IEC 60749-9:2002 EN-FR 0a33cdfc Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
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