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【国际标准】 Piezoelectric sensors - Part 3: Physical sensors
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2024-05-13
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标准简介适用范围：
暂无
标准号：
IEC 63041-3:2020 EN-FR
标准名称：
Piezoelectric sensors - Part 3: Physical sensors
英文名称：
Piezoelectric sensors - Part 3: Physical sensors标准状态：
现行-
发布日期：
2020-08-12 -
实施日期：
出版语种：
EN-FR
- 推荐标准
- IEC 61837-2:2011 EN-FR ac8770ed Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-2:2018 EN 9b847751 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-2:2018/AMD1:2020 EN 04c10f4e Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-2:2018/AMD1:2020 EN-FR e79f8c5b Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-3:2015 EN-FR 4d511c82 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
- IEC 62047-30:2017 EN 82a50db2 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
- IEC 62047-33:2019 EN ea621cee Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
- IEC 62047-34:2019 EN c830a7c5 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
- IEC 62276:2012 EN-FR cb8b3f29 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- IEC 62604-2:2022 EN-FR 91b7c1a4 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
- IEC 62884-2:2017 EN 7b87a9d2 Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method
- IEC 62884-2:2017 EN-FR 9e250648 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
- IEC 62884-3:2018 EN 513a5450 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- IEC 62884-3:2018 EN-FR 27d65c30 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- IEC 63041-1:2021 RLV EN b6904df0 Piezoelectric sensors - Part 1: Generic specifications
