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【国际标准】 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
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标准简介适用范围：
暂无
标准号：
IEC 62951-3:2018 EN
标准名称：
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
英文名称：
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging标准状态：
现行-
发布日期：
2018-11-07 -
实施日期：
出版语种：
EN
- 其它标准
- 上一篇： IEC 62951-2:2019 EN-FR 9bfc77fb Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
- 下一篇： IEC 62951-4:2019 EN-FR bd8a8d66 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
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