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- IEC 62788-1-4:2016/AMD1:2020 EN-FR 69e0b347 Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 1-4: Encapsulants - Measurement of optical transmittance and calculation of the solar-weighted photon transmittance, yellowness index, and UV cut-off wavelength

【国际标准】 Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 1-4: Encapsulants - Measurement of optical transmittance and calculation of the solar-weighted photon transmittance, yellowness index, and UV cut-off wavelength
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适用范围:
暂无
标准号:
IEC 62788-1-4:2016/AMD1:2020 EN-FR
标准名称:
Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 1-4: Encapsulants - Measurement of optical transmittance and calculation of the solar-weighted photon transmittance, yellowness index, and UV cut-off wavelength
英文名称:
Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 1-4: Encapsulants - Measurement of optical transmittance and calculation of the solar-weighted photon transmittance, yellowness index, and UV cut-off wavelength标准状态:
现行-
发布日期:
2020-10-15 -
实施日期:
出版语种:
EN-FR
- 其它标准
- 上一篇: IEC 62788-1-4:2016+AMD1:2020 CSV EN-FR e804a177 Measurement procedures for materials used in photovoltaic modules - Part 1-4: Encapsulants - Measurement of optical transmittance and calculation of the solar-weighted photon transmittance, yellowness index, and UV cut-off wavelength
- 下一篇: IEC 62788-1-5:2016 EN-FR a5a8ae45 Measurement procedures for materials used in photovoltaic modules - Part 1-5: Encapsulants - Measurement of change in linear dimensions of sheet encapsulation material resulting from applied thermal conditions
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